文章基本信息

标题：A Method for Test Pattern Generation of Combinational Circuits Using Ordinary Algebra
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作者：Zubair Ahmad
期刊名称：International Journal of Computer and Information Technology
印刷版ISSN：2279-0764
出版年度：2012
卷号：1
期号：1
页码：1
出版社：International Journal of Computer and Information Technology
摘要：This paper introduces ordinary algebra to express the truth value of a logic function. The algebraic expressions are based on switching variables that take the values 0, 1, or unspecified. The expressions contain addition and subtraction operators from ordinary algebra. It is shown that these algebraic expressions can be used in conjunction with the Boolean difference equation to generate test patterns for a combinational logic circuit. The test pattern generation method is complete because it will find a test set for a fault or otherwise prove the fault to be untestable.
关键词：ATPG; 0-1 controllability; observability; ; stuck-at faults