期刊名称:International Journal of Innovative Research in Science, Engineering and Technology
印刷版ISSN:2347-6710
电子版ISSN:2319-8753
出版年度:2015
卷号:4
期号:3
页码:1113
DOI:10.15680/IJIRSET.2015.0403065
出版社:S&S Publications
摘要:Ternary ZnIn2S4 (ZIS) films were deposited on a glass substrate using Spray pyrolysis method. Theproperties of as-deposited ZnIn2S4 film and annealed films were characterized using the XRD, UV-Vis-NIRspectroscopy and Raman spectrum, FESEM, EDAX and Photoluminance. The XRD result shows the hexagonalstructure. Optical study shows the maximum transparency of nearly 88% for 550°C annealed film (ZIS-T5).Absorptionedge for as-deposited (ZIS) , annealed films (ZIS-T1 -350°C, ZIS-T2 - 450°C and ZIS-T3 - 550°C) values found to be536 nm and 525 nm, 498nm and 441nm.Band gap(Eg) values of the as-deposited, annealed film (350°C, 450°C, 550°C)values were estimated at 2.79 eV,2.89 eV, 2.94 eV and 3.3eV respectively. Morphology of as-deposited ZnIn2S4 filmshows the rulles dollops rather than a microsphere, EDAX spectrum showed the Composition of the film closed to thestoichiometric compound. From the Pl spectrum strong emission band at ∼470 nm was observed for as-deposited (ZIS)and annealed films (ZIS-T1, ZIS-T2).