文章基本信息

标题：An Effective Test and Diagnosis Algorithm for Dual-Port Memories
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作者：Park, Young-Kyu ; Yang, Myung-Hoon ; Kim, Yong-Joon 等
期刊名称：ETRI Journal
印刷版ISSN：1225-6463
电子版ISSN：2233-7326
出版年度：2008
卷号：30
期号：4
页码：555-564
语种：English
出版社：Electronics and Telecommunications Research Institute
摘要：This paper proposes a test algorithm that can detect and diagnose all the faults occurring in dual-port memories that can be accessed simultaneously through two ports. In this paper, we develop a new diagnosis algorithm that classifies faults in detail when they are detected while the test process is being developed. The algorithm is particularly efficient because it uses information that can be obtained by test results as well as results using an additional diagnosis pattern. The algorithm can also diagnose various fault models for dual-port memories.
关键词：Dual-port memories;test algorithm;diagnosis;fault classification;fault model;fault dictionary;fault primitive