文章基本信息

标题：Differential Fault Analysis for Round-Reduced AES by Fault Injection
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作者：Park, Jea-Hoon ; Moon, Sang-Jae ; Choi, Doo-Ho 等
期刊名称：ETRI Journal
印刷版ISSN：1225-6463
电子版ISSN：2233-7326
出版年度：2011
卷号：33
期号：3
页码：434-442
DOI：10.4218/etrij.11.0110.0478
语种：English
出版社：Electronics and Telecommunications Research Institute
摘要：This paper presents a practical differential fault analysis method for the faulty Advanced Encryption Standard (AES) with a reduced round by means of a semi-invasive fault injection. To verify our proposal, we implement the AES software on the ATmega128 microcontroller as recommended in the standard document FIPS 197. We reduce the number of rounds using a laser beam injection in the experiment. To deduce the initial round key, we perform an exhaustive search for possible key bytes associated with faulty ciphertexts. Based on the simulation result, our proposal extracts the AES 128-bit secret key in less than 10 hours with 10 pairs of plaintext and faulty ciphertext.
关键词：AES;fault attack;differential fault attack