文章基本信息

标题：Analysis of Failure in Miniature X-ray Tubes with Gated Carbon Nanotube Field Emitters
本地全文：下载
作者：Kang, Jun-Tae ; Kim, Jae-Woo ; Jeong, Jin-Woo 等
期刊名称：ETRI Journal
印刷版ISSN：1225-6463
电子版ISSN：2233-7326
出版年度：2013
卷号：35
期号：6
页码：1164-1167
DOI：10.4218/etrij.13.0213.0346
语种：English
出版社：Electronics and Telecommunications Research Institute
摘要：We correlate the failure in miniature X-ray tubes with the field emission gate leakage current of gated carbon nanotube emitters. The miniature X-ray tube, even with a small gate leakage current, exhibits an induced voltage on the gate electrode by the anode bias voltage, resulting in a very unstable operation and finally a failure. The induced gate voltage is apparently caused by charging at the insulating spacer of the miniature X-ray tube through the gate leakage current of the field emission. The gate leakage current could be a criterion for the successful fabrication of miniature X-ray tubes.
关键词：Carbon nanotube;field emission;triode;miniature X-ray tube;charging