文章基本信息

标题：Test Point Insertion with Control Point by Greater Use of Existing Functional Flip-Flops
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作者：Yang, Joon-Sung ; Touba, Nur A.
期刊名称：ETRI Journal
印刷版ISSN：1225-6463
电子版ISSN：2233-7326
出版年度：2014
卷号：36
期号：6
页码：942-952
DOI：10.4218/etrij.14.0113.1121
语种：English
出版社：Electronics and Telecommunications Research Institute
摘要：This paper presents a novel test point insertion (TPI) method for a pseudo-random built-in self-test (BIST) to reduce the area overhead. Recently, a new TPI method for BISTs was proposed that tries to use functional flip-flops to drive control test points instead of adding extra dedicated flip-flops for driving control points. The replacement rule used in a previous work has limitations preventing some dedicated flip-flops from being replaced by functional flip-flops. This paper proposes a logic cone analysis-based TPI approach to overcome the limitations. Logic cone analysis is performed to find candidate functional flop-flops for replacing dedicated flip-flops. Experimental results indicate that the proposed method reduces the test point area overhead significantly with minimal loss of testability by replacing the dedicated flip-flops.
关键词：Test point insertion;BIST;control point;logic cone analysis;functional flip-flop