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  • 标题:Two Step Approach For Software Reliability: HLSRGM
  • 本地全文:下载
  • 作者:Dr. R. Satya Prasad ; Shaheen ; G. Krishna Mohan
  • 期刊名称:International Journal of Computer Trends and Technology
  • 电子版ISSN:2231-2803
  • 出版年度:2013
  • 卷号:4
  • 期号:10-2
  • 出版社:Seventh Sense Research Group
  • 摘要:Software Reliability Growth Model (SRGM) is a mathematical model of how the software reliability improves as faults are detected and repaired. The performance of SRGM is judged by its ability to fit the software failure data. How good does a mathematical model fit to the data and reliability of software is presented in the current paper. The model under consideration is the, HLSRGM (HalfLogistic Software Reliability Growth Model). A two step approach is used to estimate the model parameters by combination of Maximum Likelihood Estimation (MLE) and regression. To assess the performance of the considered SRGM, we have carried out the parameter estimation on the real software failure data sets.
  • 关键词:HLSRGM; MLE; LSE; SRGM; goodness of fit; regression
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