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标题：Data Acquisition and Reduction Algorithm for Shearing Interferometer Based Long Trace Profilometer
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作者：M. Mohamed Ismail ; A.K. Saxena
期刊名称：International Journal of Computer Trends and Technology
电子版ISSN：2231-2803
出版年度：2014
卷号：10
期号：4
DOI：10.14445/22312803/IJCTT-V10P139
出版社：Seventh Sense Research Group
摘要：The Long Trace Profilometer (LTP) is a noncontact optical profiling instrument, designed to measure the absolute surface figure to nanometer accuracy of long strip flat, spherical and aspherical Xray optics of up to 1200mm in length of distance. A key feature of the LTP is the wide range of surface shapes that it can measure. The ease of alignment and great flexibility are a result of the unique LTP optical system. The direct slope measuring capability of the LTP has proven to be very valuable in the measurement of synchrotron beam line optics and other xray mirrors[2]. A new polarization Shearing Interferometer based Long Trace Profilometer has been developed and built at Indian Institute of Astrophysics, Bangalore. This paper gives details of the data reduction software for profile calculation at sub pixel level accuracy.
关键词：Data Acquisition; LTP; Babinet Compensator; CCD; Shearing Interferometer.