文章基本信息

标题：An efficient methodology for measurement of the average electrical properties of single one-dimensional NiO nanorods
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作者：Ranjit A. Patil ; Rupesh S. Devan ; Jin-Han Lin 等
期刊名称：Scientific Reports
电子版ISSN：2045-2322
出版年度：2013
卷号：3
DOI：10.1038/srep03070
出版社：Springer Nature
摘要：We utilized a metal tantalum (Ta) ball-probe to measure the electrical properties of vertical-aligned one-dimensional (1D) nickel-oxide (NiO) nanorods. The 1D NiO nanorods (on average, ~105 nm wide and ~700 nm long) are synthesized using the hot-filament metal-oxide vapor deposition (HFMOVD) technique, and they are cubic phased and have a wide bandgap of 3.68 eV. When the 1D NiO nanorods are arranged in a large-area array in ohmic-contact with the Ta ball-probe, they acted as many parallel resistors. By means of a rigorous calculation, we can easily acquire the average resistance R_NR and resistivity ρ_NR of a single NiO nanorod, which were approximately 3.1 × 10¹³ Ω and 4.9 × 10⁷ Ω.cm, respectively.