We investigated the effect of organic emission layer in the fabrication of see-through organic light emitting diodes (see-through OLED). Three kind of see-through OLEDs were fabricated. The each cathode used for a typical transparent conducting oxide (In₂O₃-SnO₂ (ITO), In₂O₃-ZnO (IZO), ZnO-Al₂O₃ (AZO)) was prepared by rf magnetron sputtering at room temperature. In see-through OLED with each cathode, we are able to confirm that the overall device emits light. To understand the damage of organic films, we measured a PL spectrum of the organic emission layer before and after sputtering. In each transparent cathode, PL intensity decreases after sputtering. The underlying emission layer in the light emitting devices incurred some damage during the conventional rf magnetron sputter deposition process.