文章基本信息

标题：低電圧CMOSディジタル回路のプロセスバラツキ補正技術
本地全文：下载
作者：次田祐輔 ; 廣瀬哲也 ; 上野憲一等
期刊名称：映像情報メディア学会誌
印刷版ISSN：1342-6907
电子版ISSN：1881-6908
出版年度：2009
卷号：63
期号：11
页码：1667-1670
DOI：10.3169/itej.63.1667
出版社：The Institute of Image Information and Television Engineers
摘要：In low-voltage CMOS digital circuits, the threshold voltage variation causes significant circuit performance fluctuation: we therefore propose on-chip process compensation techniques for such circuits. We used voltage reference circuits, that can monitor process variations. We confirmed the operation of the circuit by using a SPICE simulation with a set of 0.35-μm standard CMOS parameters, and we performed Monte Carlo simulations assuming process spread and device mismatch in all MOSFETs. SPICE simulation demonstrated that the process variations of digital circuits were improved by 45% after applying the proposed architecture. These techniques will be useful for the on-chip process compensation of low-voltage digital circuits.
关键词：低電圧CMOSディジタル回路;閾値電圧バラツキ;バラツキ補正