文章基本信息

标题：光導電測定による2種類の還元増感核の検出
本地全文：下载
作者：長谷川朗 ; 井村智和 ; 黒川英夫等
期刊名称：日本写真学会誌
印刷版ISSN：0369-5662
电子版ISSN：1884-5932
出版年度：1993
卷号：56
期号：4
页码：270-275
出版社：The Society of Photographic Science and Technolgy of Japan
摘要：A cubic bromide emulsion was reduction sensitized at pAgs 5.6 and 7.3 and an octahedral silver bromide emulsion at pAg 8.9. The sensitizer used was SnCl₂·2H₂O. The sensitized cubic microcrystals showed an increase in microwave photoconductivity (MPC) at both pAgs while MPC decreased insensitized octahedral microcrystals. For the cubic microcrystals at pAg 7.3 the MPC increased with increasing sensitizer concentration until just before the appearance of fog. At pAg 5.6, however, MPC did not increase with increasing sensitizer concentration. With the octahedral microcrystals, increasing sensitizer concentration resulted in a corespondingly lower MPC. In both the cubic and octahedral emulsions, once fog appeared, MPC decreased to a lower value than in the unsensitized emulsion. These results are considered to be direct evidence for the production of both electron traps and hole traps by reduction sensitization.