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文章基本信息

  • 标题:Experimental and Numerical Approaches for Reliability Evaluation of Electronic Packaging
  • 本地全文:下载
  • 作者:Soon-Bok LEE ; Jae-Won JANG
  • 期刊名称:Journal of Computational Science and Technology
  • 电子版ISSN:1881-6894
  • 出版年度:2013
  • 卷号:7
  • 期号:2
  • 页码:265-277
  • DOI:10.1299/jcst.7.265
  • 出版社:The Japan Society of Mechanical Engineers
  • 摘要:There are two major methods, experimental and numerical approaches, for dealing with the strain and stress analysis essential to reliability assessment of electronic packaging. Both approaches are mutually complementary in view point of their assessment capability. In this paper, experimental and numerical simulation results for analyzing some reliability issues of electronic packages were reviewed, and the role of both approaches were discussed.
  • 关键词:Experimental Method;Numerical Analysis;Reliability Evaluation;Electronic Packaging;Fatigue
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