文章基本信息

标题：On Delay Test Quality for Test Cubes
本地全文：下载
作者：Shinji Oku ; Seiji Kajihara ; Yasuo Sato 等
期刊名称：Information and Media Technologies
电子版ISSN：1881-0896
出版年度：2010
卷号：5
期号：4
页码：1147-1155
DOI：10.11185/imt.5.1147
出版社：Information and Media Technologies Editorial Board
摘要：This paper proposes a method to compute delay values in 3-valued fault simulation for test cubes which are test patterns with unspecified values (Xs). Because the detectable delay size of each fault by a test cube is not fixed before assigning logic values to the Xs in the test cube, the proposed method only computes a range of the detectable delay values of the test patterns covered by the test cubes. By using the proposed method, we derive the lowest and the highest test quality of test patterns covered by the test cubes. Furthermore, we also propose a GA (genetic algorithm)-based method to generate fully specified test patterns with high test quality from test cubes. Experimental results for benchmark circuits show the effectiveness of the proposed methods.