文章基本信息

标题：Estimation of Delay Test Quality and Its Application to Test Generation
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作者：Seiji Kajihara ; Shohei Morishima ; Masahiro Yamamoto 等
期刊名称：Information and Media Technologies
电子版ISSN：1881-0896
出版年度：2008
卷号：3
期号：4
页码：717-728
DOI：10.11185/imt.3.717
出版社：Information and Media Technologies Editorial Board
摘要：As a method to evaluate delay test quality of test patterns, SDQM (Statistical Delay Quality Model) has been proposed for transition faults. In order to derive better test quality by SDQM, the following two things are important: for each transition fault, (1) to find out the accurate length of the longest sensitizable paths along which the fault is activated and propagated, and (2) to generate a test pattern that detects the fault through as long paths as possible. In this paper, we propose a method to calculate the length of the potentially sensitizable longest path for detection of a transition fault. In addition, we develop a procedure to extract path information that helps high quality transition ATPG. Experimental results show that the proposed method improves SDQL (Statistical Delay Quality Level) by not only accurate calculation of the longest sensitizable paths but also detection of faults through longer paths.