文章基本信息

标题：Investigating Company’s Technical Development Directions Based on Internal Knowledge Inheritance and Inventor Capabilities: The Case of Samsung Electronics
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作者：Fang Han ; Sejun Yoon ; Nagarajan Raghavan 等
期刊名称：Sustainability
印刷版ISSN：2071-1050
出版年度：2022
卷号：14
期号：5
页码：3117
DOI：10.3390/su14053117
语种：English
出版社：MDPI, Open Access Journal
摘要：This paper proposes a new method to analyze technical development directions of a company using knowledge persistence-based main path analysis and co-inventor network analysis. Main path analysis is used for identifying internal technical knowledge flows and inheritances over time within a company, and knowledge persistence-based main path analysis can well identify major knowledge streams of each sub-domain within a relatively small knowledge network generated by one company without omission of significant inventions. A co-inventor network analysis is used for identifying key inventors who can be represented as the major technical capabilities of a company. The method is a meaningful attempt in that it applies knowledge persistence-based main path analysis to analyzing a company’s internal technical development and combines the two approaches to provide the information on both base technical capabilities and new technical characteristics. To test the method, this paper conducted an empirical study of Samsung Electronics. The results show that the method generated major knowledge flows and identified key inventors of Samsung Electronics. In particular, the method can identify the base technical knowledge as the ‘backbone’ and newly injected knowledge as ‘fresh blood’ for forecasting future technical development. Based on the identified clue information, this paper forecasted the potential future technologies for each sub-domain of Samsung Electronics with technical keywords and descriptions.