摘要:This paper reports the effects of quantum well width on material gain and lasing wavelength of the InGaAsP / InP lasing nano-heterostructure which is based on simple SCH (Separate Confinement Heterostructure) design. The studies made in this paper are directed towards the well width dependent modeling of InGaAsP / InP lasing nano-heterostructure and simulation of the lasing characteristics such as material gain, differential gain, anti-guiding factor and refractive index change with carrier density. The outcomes of the work reported in this paper suggest that both the material gain and lasing wavelength can be controlled by varying width of the quantum well sandwiched between the barriers followed by claddings in the nano-structure. Since, the maximum material gain has been achieved at wavelength of 1.35 µm for minimum quantum well width (2 nm) with in TE mode; therefore, InGaAsP / InP based nano-heterostructure with 2 nm well width may be very useful in the area of nano-opto-electronics.
关键词:material gain; anti-guiding factor; InGaAsP; differential gain; carrier density