文章基本信息

标题：Millimeter‐wave diffraction‐loss model based on over‐rooftop propagation measurements
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作者：Kyung‐Won Kim ; Myung‐Don Kim ; Juyul Lee 等
期刊名称：ETRI Journal
印刷版ISSN：1225-6463
电子版ISSN：2233-7326
出版年度：2020
卷号：42
期号：6
页码：827-836
DOI：10.4218/etrij.2019-0411
语种：English
出版社：Electronics and Telecommunications Research Institute
摘要：Measuring the diffraction loss for high frequencies, long distances, and large diffraction angles is difficult because of the high path loss. Securing a well‐controlled environment to avoid reflected waves also makes long‐range diffraction measurements challenging. Thus, the prediction of diffraction loss at millimeter‐wave frequency bands relies on theoretical models, such as the knife‐edge diffraction (KED) and geometrical theory of diffraction (GTD) models; however, these models produce different diffraction losses even under the same environment. Our observations revealed that the KED model underestimated the diffraction loss in a large Fresnel‐Kirchhoff diffraction parameter environment. We collected power‐delay profiles when millimeter waves propagated over a building rooftop at millimeter‐wave frequency bands and calculated the diffraction losses from the measurements while eliminating the multipath effects. Comparisons between the measurements and the KED and GTD diffraction‐loss models are shown. Based on the measurements, an approximation model is also proposed that provides a simple method for calculating the diffraction loss using geometrical parameters.