文章基本信息

标题：Reliability Analysis of the 300W GaInP/GaAs/Ge Solar Cell Array Using PCM
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作者：Goo-Hwan Shin ; Se-Jin Kwon ; Hu-Seung Lee 等
期刊名称：Journal of Astronomy and Space Sciences
印刷版ISSN：2093-5587
电子版ISSN：2093-1409
出版年度：2019
卷号：36
期号：2
页码：69-74
DOI：10.5140/JASS.2019.36.2.69
语种：English
出版社：Korean Space Science Society
摘要：Spacecraft requires sufficient power in orbit to perform its mission. So as to comply with system requirements, the sufficient power should be made by a solar cell array by photovoltaic power conversion. A life time of space program depends on its mission considering parts reliability and parts grade. Based on the mission life time, power equipment might be designed to meet specifications. In outer space, solar cell array might generate the dc power by photovoltaic conversion effects and GaInP/GaAs/Ge solar cells are used in this study. Space programs that require more than five years should select parts for high reliability applications. Therefore, reliability analysis for high reliability applications should be performed to check its fulfilment of the requirements. This program should also require more five years for its mission and we performed its analysis using parts count method (PCM) for its reliability. Finally, we performed reliability analysis and obtained quantitative figures found out 99.9%. In this study, we presented the reliability analysis of the 300W GaInP/GaAs/Ge solar cell array.
关键词：reliability analysis;parts count method;solar cell array;GaInP/GaAs/Ge;diode;temperature