文章基本信息

标题：PROPERTIES OF VARIABLE N-DETECTION FUNCTIONAL DELAY FAULT TESTS
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作者：Bareiša, Eduardas ; Jusas, Vacius ; Motiejūnas, Kęstutis 等
期刊名称：Information Technology And Control
印刷版ISSN：2335-884X
出版年度：2008
卷号：37
期号：2
DOI：10.5755/j01.itc.37.2.11935
语种：English
出版社：Kaunas University of Technology
摘要：The analysis how the functional fault tests detect structural faults at gate-level shows that the stuck-at fault coverage is much higher than transition fault coverage. The aim of the paper is to discover the reasons of this phenomenon and to propose the techniques of functional delay test quality improvement. We suggest, by transforma-tion of pin pair test into functional delay test, to use variable number of fault detections. The performed experiments show the effectiveness of the introduced approach.