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  • 标题:Design of Resistive Grain Moisture On-line Detector
  • 本地全文:下载
  • 作者:Chen Chen ; Chaohua Wu ; Cunrong Li
  • 期刊名称:MATEC Web of Conferences
  • 电子版ISSN:2261-236X
  • 出版年度:2017
  • 卷号:136
  • 页码:1-5
  • DOI:10.1051/matecconf/201713602005
  • 语种:English
  • 出版社:EDP Sciences
  • 摘要:Grain moisture detection is of great significance to the acquisition, transportation, storage, processing and trade of grain. This paper designs and develops a resistive grain moisture on-line detector, which uses the least squares method for data calibration and stores the calibrated data in the STC15F2K08S2 microcontroller. The grain moisture content is obtained by processing the collected grain resistance and grain temperature. When the grain moisture content exceeds the set value of grain moisture detector, the microcontroller will automatically control the opening of grain drying equipment so as to prevent the grain moisture content from being too high and causing mildew. Through the experimental data analysis and operation test, the detector can accurately detect the moisture content of wheat, barley, rapeseed, rice and other grain and automatically control the drying equipment, and it has the advantages of fast response, high accuracy and strong practicality, so it can meet the national grain testing accuracy requirements and automatic drying requirements.
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