文章基本信息

标题：Prediction of electronic nanodevices technical status and reliability based on analysis of their performance parameters kinetics under the influence of external factors
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作者：Mstislav Makeev ; Sergey Meshkov ; Vladimir Sinyakin 等
期刊名称：MATEC Web of Conferences
电子版ISSN：2261-236X
出版年度：2017
卷号：129
页码：1-4
DOI：10.1051/matecconf/201712903019
语种：English
出版社：EDP Sciences
摘要：The problems of technical diagnostics of electronic nanoobjects and devices based on them are considered. Algorithms for constructing the operability and reliability prediction fields of electronic nanoobjects and devices based on them in the specified operation conditions are given.