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文章基本信息

  • 标题:Measurement Issues of Radio Frequency Integrated Circuits with Digital Control at Radiation Testing
  • 本地全文:下载
  • 作者:Konstantin Amburkin ; Konstantin Amburkin ; George Chukov
  • 期刊名称:MATEC Web of Conferences
  • 电子版ISSN:2261-236X
  • 出版年度:2016
  • 卷号:79
  • 页码:1-7
  • DOI:10.1051/matecconf/20167901041
  • 语种:English
  • 出版社:EDP Sciences
  • 摘要:The results of the development of a portable logical generator/analyzer to be used in an automated hardware and software measurement system for automation of research and testing of TID hardness of digitally controlled RF ICs, are provided. The device has been tested in research of precision parameters of integrated multi-bit RF vector phase shifters.
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