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  • 标题:A detector interferometric calibration experiment for high precision astrometry
  • 本地全文:下载
  • 作者:A. Crouzier ; A. Crouzier ; F. Malbet
  • 期刊名称:Astronomy & Astrophysics
  • 印刷版ISSN:0004-6361
  • 电子版ISSN:1432-0746
  • 出版年度:2016
  • 卷号:595
  • 页码:1-24
  • DOI:10.1051/0004-6361/201526321
  • 语种:English
  • 出版社:EDP Sciences
  • 摘要:Context. Exoplanet science has made staggering progress in the last two decades, due to the relentless exploration of new detection methods and refinement of existing ones. Yet astrometry offers a unique and untapped potential of discovery of habitable-zone low-mass planets around all the solar-like stars of the solar neighborhood. To fulfill this goal, astrometry must be paired with high precision calibration of the detector. Aims. We present a way to calibrate a detector for high accuracy astrometry. An experimental testbed combining an astrometric simulator and an interferometric calibration system is used to validate both the hardware needed for the calibration and the signal processing methods. The objective is an accuracy of 5 × 10-6 pixel on the location of a Nyquist sampled polychromatic point spread function. Methods. The interferometric calibration system produced modulated Young fringes on the detector. The Young fringes were parametrized as products of time and space dependent functions, based on various pixel parameters. The minimization of function parameters was done iteratively, until convergence was obtained, revealing the pixel information needed for the calibration of astrometric measurements. Results. The calibration system yielded the pixel positions to an accuracy estimated at 4 × 10-4 pixel. After including the pixel position information, an astrometric accuracy of 6 × 10-5 pixel was obtained, for a PSF motion over more than five pixels. In the static mode (small jitter motion of less than 1 × 10-3 pixel), a photon noise limited precision of 3 × 10-5 pixel was reached.
  • 关键词:astrometry;space vehicles: instruments;instrumentation: high angular resolution;methods: data analysis;techniques: interferometric
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